OnScale Multiphysics FEA software removes traditional engineering simulation software restrictions providing accurate and timely results in major engineering applications.
SEMICONDUCTOR AND MEMS
Simulate complex microelectromechanical systems devices with integrated electrical components to drive improved performance.
Investigate ultrasonic measurement systems and analyze the operation of modern fuel injectors for optimal performance.
INFRASTRUCTURE SAFETY (NDE/NDT)
Develop advanced inspections techniques, prototype novel algorithms and gain a better understanding of complex phenomena in non-destructive testing (NDT/NDE) across a range of industries.
NEXT-GENERATION MEDICAL DEVICES
Rapidly accelerate the development of next-generation diagnostic probes, improve treatment planning techniques, and pioneer innovative transduction devices.
Greatly reduce time to market for the next generation of RF filters. Virtually prototype piezoelectric filters in full 3D, explore new designs quickly and avoid expensive physical prototyping.
MICROELECTROMECHANICAL SYSTEMS (MEMS)
OnScale provides users with a unique set of capabilities for simulating a range of MEMS Devices such as PMUTs and CMUTs and RF resonators such as SAWs, FBARs, and SMRs.
Traditionally too computationally intense for general FEA, OnScale breaks this barrier and facilitates high-level, coupled design work that was previously impossible. Easily extract key industry metrics such as Electrical Impedance, Phase Shifts, S-Parameters, Bandwidth, Resonance Modes, and much more.
With fast and efficient up-front simulation, design engineers can slash prototype fabrication costs, expedite time to market, and reduce design risk.
Include the effects of embedded circuitry on performance. Electrical components can be connected to drive or receive electrode configurations.
Define electrodes with arbitrary shapes and combine with novel border rings designs. Utilize non-regular shapes to enhance performance and reduce parasitic resonances.
ADVANCED PIEZOELECTRIC MATERIALS
Define full mechanical, piezoelectric, and dielectric tensors to represent your materials. Supports simple transposition of properties for arbitrary cuts and symmetries.
Directly extract S-parameters vs. Frequency from electrical signal information. For an N-Port network, only N-simulations are required to fully capture metrics.
MATERIAL CHARACTERIZATION TOOLS
Utilize existing experimental data to run numerical optimization to extract more precise, relevant material properties for accurate simulations.
FULL 3D MODELS
Reduce approximation and fully explore your design space by modelling complete geometries. Import from CAD or other 3rd party tools to enhance workflow.
FULL ELECTRO-MECHANICAL SOLUTION
Coupled elasto-dynamic and piezoelectric effects to analyze large devices such as SAWs, FBARs, SMRs, and more. (FBARs and SMRs are forms of BAWs).
Deliver results in a fraction of the time of other FEA codes to accelerate design cycles and slash cost-bases. Parallelize runs to achieve unmatched efficiencies.