2026 矽光子產業論壇
CORNERSTONE
企業院士/ Enterprise Fellow
企業院士/ Enterprise Fellow
Dr Shengqi Yin
演講題目/Presentation topic:
Accelerating Silicon Photonics Prototyping: Closing the Design-Fabrication Loop with Open Data at CORNERSTONE
講師介紹/Speaker bio:
Dr Shengqi Yin is an Enterprise Fellow at CORNERSTONE, the University of Southampton's silicon photonics innovation platform. He has more than ten years of experience in photonic integrated circuit design, characterisation, packaging, and scalable manufacturing.
At CORNERSTONE, he leads the development of process and assembly design kits and has extensive experience in the design and tape-out of active and passive components across multiple silicon photonics platforms, including a library of more than 200 building blocks. His work focuses on design automation, system-level design, measurement, and optimisation to make photonic technologies more accessible and scalable.
His current activities span biophotonic sensing, quantum information networks, graphene photonics, and CMOS-compatible co-packaging. He also provides technical training and supports open-source PDK development. Shengqi holds a PhD from the University of Southampton and received the 2025 Paul F. Forman Team Engineering Excellence Award.
Presentation abstract:
CORNERSTONE is a UK silicon photonics pilot-line facility and open-access foundry supporting multiple material platforms, hybrid integration, and heterogeneous integration. Through open process and assembly design kits and design support, CORNERSTONE aims to accelerate the translation of academic innovation into industrial applications.
This talk presents CORNERSTONE's data-driven EDA ecosystem. Its PDK Monitor records metrology data from every slot of each multi-project wafer run, including etch characteristics, sidewall profiles, and deposited-layer thicknesses sampled using metrology boxes. Common optical test structures are measured across runs, enabling fabrication-induced variation to be quantified through spectral shifts and dispersion. Aligning design parameters with fabrication metrology and post-fabrication measurements helps designers understand the relationship between idealised models and manufactured devices, calibrate design assumptions, and improve subsequent tape-outs.
These datasets are available for designers to query, while automated standardisation and post-processing are under development. Open YAML-based interfaces support integration with established mainstream EDA workflows. By releasing verified fabrication data and enabling users to contribute selected design data, CORNERSTONE is building an ecosystem for faster, fabrication-aware silicon photonics prototyping.